Goldstein, Joseph
[VerfasserIn];
Newbury, Dale E.
[VerfasserIn];
Michael, Joseph R.
[VerfasserIn];
Ritchie, Nicholas W. M.
[VerfasserIn];
Scott, John Henry J.
[VerfasserIn];
Joy, David C.
[VerfasserIn]
Scanning electron microscopy and X-ray microanalysis
- [Fourth edition]
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Medientyp:
Buch
Titel:
Scanning electron microscopy and X-ray microanalysis
Weitere Titel:
Abkürzungstitel: SEMXM
Auf dem Buchdeckel: Extras online
Enthält:
Electron beam-specimen interactions -- Backscattered electrons -- Secondary electrons -- X-rays -- SEM instrumentation -- Image formation -- SEM image interpretation -- The visibility of features in SEM images -- Image defects -- High resolution imaging -- Low beam energy SEM -- Variable pressure SEM (VPSEM) -- ImageJ and Fiji -- SEM imaging checklist -- SEM case studies -- Energy dispersive X-ray spectrometry -- DTSA-II EDS software -- Qualitative elemental analysis by energy dispersive X-ray spectrometry -- Quantitative analysis -- Trace analysis by SEM/EDS -- Low beam energy X-ray microanalysis -- Analysis of specimens with special geometry -- Compositional mapping -- Attempting electron-excited X-ray microanalysis in the variable pressure scanning electron microscope (VPSEM) -- Energy dispersive X-ray microanalysis checklist -- Case studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused ion beam application in the SEM laboratory -- Ion beam microscopy